Greg M. Johnson

@semiconodon.bsky.social

124 Followers 382 Following

Mapping electrical properties for fun and profit. Apps Dev @ Carl Zeiss Microscopy. Opinions my own.

Scanning electron microscope, image of an atomic force microscopy diamond tip resting on a 7 nm delayered SRAM. AFM-in-SEM can simultaneously mill and look for electrical anomalies. It’ll be a great talk.